You will take on a technical leadership role within the Test Development Engineering team, responsible for architecting, developing, and deploying Automated Test Equipment (ATE) solutions for modern, highly complex ASICs and SoCs. You will own the end-to-end test development lifecycle from pre-silicon DFT engagement to post-silicon bring-up and high-volume manufacturing (HVM) release.
As a senior technical driver, your responsibilities will include:
• Test Architecture & Development: Architect, write, and debug complex ATE test programs for wafer sort and final test
• Silicon Bring-Up: Lead first-silicon ATE bring-up, characterization, and validation of complex networking processors and multi-die packages.
• DFT Collaboration: Partner closely with Design for Test (DFT) and ASIC design teams during the pre-silicon phase to define testability requirements, evaluate test coverage, and simulate test vectors (SCAN, MBIST, JTAG, High-Speed I/O).
• Yield & Test Time Optimization: Drive pivotal initiatives for Test Time Reduction (TTR) and yield optimization without compromising test coverage or product quality.
• Manufacturing Deployment: Lead the seamless transfer and release of robust test programs to offshore assembly and test (OSAT) partners. Resolve complex test-related issues in high-volume manufacturing.
• Mentorship & Leadership: Serve as a domain expert and technical escalation point. Mentor junior engineers and drive continuous improvement in test methodologies and automation.